Founded on July 9, 2010, Weinan Woodking intelligent technology Co.,Ltd. is a national high-tech enterprise specializing in the development and manufacturing of microelectronic hardware test probes and the development and application of new materials. In the field of test segmentation, it can provide customers with integrated services such as test probes, test fixtures, test equipment and test solutions.

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How should the test probe be maintained?

How to maintain the ICT test probes in the test fixture? Nowadays, the test probes are widely used by users, and various problems will inevitably occur. Then, Huaronghua Electronics will tell you how to maintain the test probes:

What are the uses of test probes

Test pins, also called test probes in the industry, are divided into pogo pins (special pins) and general pins when used for PCB board testing. When pogo pins are used, a test mold needs to be made according to the wiring of the tested PCB board, and Under normal circumstances, a mold can only test one type of PCB board; when the universal pin is used, it only needs to have enough points, so many manufacturers now use the universal pin; the pogo pin is divided into PCB board probes according to the usage. Pins, ICT probes, BGA probes, PCB board probes are mainly used for PCB board testing, ICT probes are mainly used for online testing after plug-ins, and BGA probes are mainly used for BGA package testing and chip testing.

Maintenance items for high-frequency probes

1. Wire and connector maintenance method: (1) Generally, the number of locks of SMA connectors is about 500 times (if the number of times of use is exceeded, please try to eliminate and replace them to avoid abnormal test);

Let's talk about the benefits of gold-plated spring current charging pins

1. Improve the working performance of the spring current charging needle The electroplated layer on the surface of the spring current charging pin not only protects the connector, but also improves the performance of some aspects. The electroplated layer is the protector of the normal use of the connector.

Principles of semiconductor test probes

Semiconductor test probes (high-frequency probes) are mainly used in BGA chip testing, micro-BGA originals, test racks, mobile phones, computers, communications, etc.; its application rating is 500MHz, and the number of pins used in the test is based on the specific BGA The specifications of IC and its jig are different. The distance between test jigs is 0.4/0.5/0.65/0.75/1.0/1.27/2/2.54MM.
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Add: No. 18, Chongye 2nd Road, High tech Industrial Development Zone, Weinan City, Shaanxi Province
Tel: +86-913-2555778 
Fax: +86-913-2116777


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Copyright© 2021  Weinan Woodking intelligent technology Co.,Ltd.

陕ICP备16004637号    Powered by